The study of sing event function interrupt on MRAM

The experiment shows that when the laser energy reaches 600pJ (equivalent LET value is 25Mev.cm^2/mg), the cyclic reading function of the circuit fails and the function is interrupted, and the sensitive area where the single-particle function interruption occurs is located at the bottom of the device in a peripheral read circuit consisting of several sensitive amplifiers.

Based on the current gain G in the sensitive region when read failure occurs, this phenomenon is not mSEL. At the same time, according to the feedback factor <1, it is determined that the reading circuit when high-energy particles irradiate the device is due to the positive feedback effect and the function is interrupted.