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Data · dataset · 2026

Related data of Neural Network Model for Predicting Thin-Film Structural Parameters Based on X-Ray Reflectivity Curve Features

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Related data of Neural Network Model for Predicting Thin-Film Structural Parameters Based on X-Ray Reflectivity Curve Features.Including Structure of films,.

Description

Heatmap of Spearman Correlation Coefficients Between Thin Film Parameters and XRR Curve Feature Parameters and so on.

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Catalogue records · 1

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Provenance · 1 source records, 10 field assertions
SourceKeyLast seenRaw
ScienceDB10.57760/sciencedb.368118 d agoJSON v1
FieldAssertionExtractorEvidence
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