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Data · dataset · 2026

Titanium Nitride Chemical Mechanical Polishing Process Optimization Dataset

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AFM data were measured by randomly selecting points using a PARK XE-150 atomic force microscope, and the Ra values were directly read.HRTEM and EELS data were obtained from TiN after polishing.

Description

The samples were prepared by FIB and subsequently measured on a JEOL JEM-ARM300F double aberration-corrected transmission electron microscope.Resistivity data were measured using a four-point probe resistivity meter, and the average value of three measurements was taken.

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Where it is published

Catalogue records · 1

Topics

Inferred from text
Analytical chemistry 69%
Provenance · 1 source records, 12 field assertions
SourceKeyLast seenRaw
ScienceDB10.57760/sciencedb.j00273.0005412 d agoJSON v1
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