Evolution of surface morphology and phase composition of zirconium hydride under laser irradiation

The laser ablation area was subjected to micro nano processing using a focused ion beam (FIB) with processing parameters of acceleration voltage of 30 kV, beam current of 0.3 nA, and depth of 4 μ m. The surface roughness of the sample was analyzed using Confocal Laser Scanning Microscopy (CLSM) and Atomic Force Microscopy (AFM), and the phase of the sample was characterized using X-ray Diffraction (XRD).

The phase composition was determined based on the JCPDS file provided by the International Diffraction Data Center, and the unit cell parameters were determined using Rietveld refinement method.