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Data · dataset · 2015

Dispersion relations for MAPI deposited on a Si wafer

Listed in DataCite

Dispersion relations for MAPI deposited on a Si wafer.

Description

Measured using variable angle spectroscopic ellipsometry and fit using the following oscillators: - Tauc-Lorentz Eg 1.55 E 0 1.63 A0 23.9

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Provenance · 2 source records, 10 field assertions
SourceKeyLast seenRaw
DataCite10.6084/m9.figshare.140568314 d agoJSON v1
DataCite10.6084/m9.figshare.1405683.v114 d agoJSON v1
FieldAssertionExtractorEvidence
access_levelsource · DataCiteconnector:datacite@1.0.0/data/attributes/rightsList
byte_sizesource · DataCiteconnector:datacite@1.0.0
concepts[field].fos:physical-sciencessource · DataCiteconnector:datacite@1.0.0
concepts[field].fos:physical-sciencessource · DataCiteconnector:datacite@1.0.0
created_datesource · DataCiteconnector:datacite@1.0.0
descriptionsource · DataCiteconnector:datacite@1.0.0/data/attributes/descriptions
licensesource · DataCiteconnector:datacite@1.0.0/data/attributes/rightsList
publication_datesource · DataCiteconnector:datacite@1.0.0/data/attributes/dates
titlesource · DataCiteconnector:datacite@1.0.0/data/attributes/titles/0/title
updated_datesource · DataCiteconnector:datacite@1.0.0