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Data · dataset · 2026

Error rate of different page types across P/E cycles

Listed in ScienceDB

This dataset corresponds to 3D TLC NAND flash memory chips subjected to 4,000 program/erase (P/E) cycles and 3D QLC NAND flash memory chips subjected to 3,000 P/E cycles, respectively.

Description

Using the test logic integrated within the SOPC system, erase operations were first performed on the test blocks, followed by writing random data. The data was then read back, and the raw bit error rate was statistically analyzed according to different page types.

Finally, the error rate variation curve was plotted as shown in the figure.

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Provenance · 1 source records, 11 field assertions
SourceKeyLast seenRaw
ScienceDB10.57760/sciencedb.space.0354610 d agoJSON v1
FieldAssertionExtractorEvidence
access_levelsource · scidb cnconnector:scidb_cn@1.0.0
concepts[field].anzsrc:group:4009enrichment · scidb cntaxonomy-embedding@1.0.0title+keywords+description (69%)
concepts[field].local:field:earth-environmentalmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:engineeringmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:humanitiesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:life-sciencesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:social-sciencemapping · scidb cnconnector:scidb_cn@1.0.0
descriptionsource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/description
license_textsource · scidb cnconnector:scidb_cn@1.0.0
publication_datesource · scidb cnconnector:scidb_cn@1.0.0
titlesource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/title