← Search

Data · dataset · 2025

Investigation of tin whisker growth behavior in COTS components under thermal vacuum cycling

Listed in ScienceDB

Tin whisker growth in COTS components was studied under thermal vacuum and air cycling.

Description

Results show higher susceptibility in ceramic capacitors, stress-driven mechanisms as the main cause, and faster growth in vacuum due to thinner oxide films.

Links

Where it is published

Catalogue records · 1

Topics

Provenance · 1 source records, 10 field assertions
SourceKeyLast seenRaw
ScienceDB10.57760/sciencedb.space.0300911 d agoJSON v1
FieldAssertionExtractorEvidence
access_levelsource · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:earth-environmentalmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:engineeringmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:humanitiesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:life-sciencesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:social-sciencemapping · scidb cnconnector:scidb_cn@1.0.0
descriptionsource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/description
licensesource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/rights
publication_datesource · scidb cnconnector:scidb_cn@1.0.0
titlesource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/title