Measurement data for the dissertation on "Increasing the EMI-Robustness of Operational Amplifier Circuits Throughout the IC Design Flow"

Each type of test chip contains the reference structure, as well as an EMI-improved structure. These measurement data contain the results of the DC and AC behaviour to extract the technological offset, the open loop gain, the gain bandwidth product, the phase margin and the power consumption, as well as EMIRR data with amplitudes and frequency sweeps of the EMI disturbance.