The test data for the VATA460 chip used in semiconductor sensors

The tests cover baseline, linearity, dynamic range, internal calibration, and external calibration to validate front-end readout performance. Data support detector energy response calibration and multi-channel consistency evaluation.Generation & Processing: DC power supply for chip biasing; signal generator for level injection; on-chip 10-bit Wilkinson ADC for digitization; FPGA for data acquisition and readout.

Raw ADC code values recorded directly without filtering or fitting.Time: September 2025 to September 2026.Channels: CH1–CH32 (32 input channels).Test Items: Baseline (baseline offset per channel), Linearity (ADC response vs. input amplitude), Dynamic Range (~90 fC), Internal Calibration (on-chip test charge injection), External Calibration (external pulse injection).Columns: Channel number (1–32), input signal amplitude (mV), ADC output code value (LSB), conversion factor (mV/LSB), timestamp.Missing Data: Channels 19 and 27 in March 2026 (~2% data loss) due to poor fixture contact.Errors: System noise (±1 LSB), temperature drift (±0.3% over 25°C ± 2°C), contact resistance (±0.5 mV).Format: TXT files, readable with common text editors or data processing software (Excel, Python, MATLAB).