Fatigue Properties of Graphene Interconnects on Flexible Substrates

The results of the in-depth characterization of Graphene are reported and based on Atomic Force Microscopy (AFM), Raman Spectroscopy and Scanning Electron Microscopy (SEM) are reported. The fatigue characteristics of ITO were determined at stress amplitudes ranging from 2000 MPa to 400 MPa up to 5000 cycles. The fatigue characteristics of Graphene were determined at stress amplitudes ranging from 80 GPa to 40 GPa up to 5000 cycles.

The fatigue S-N curves were determined and showed that Graphene's endurance limit is 40 GPa. Beyond the endurance limit, there is no observable high cycle or low cycle fatigue indication for Graphene on a flexible substrate such as PEN. The microstructural analysis by SEM and AFM did not reveal normal fatigue crack growth and propagation.

This thesis presents the first comprehensive behavior of Graphene in a bending fatigue stress environment present in numerous flexible electronic applications. The design and stress environments for safe operation has been defined.