Mg2+-Si4+ co-doped TAG ceramics

the TAG ceramic were sintered at 1650 ℃ for 20 h in induction heating vacuum furnace under vacuum pressure of 1.0×10-3 Pa,Phase characterization was performed by an X-ray diffractometer (XRD, D8 ADVANCE, Bruker, Germany) equipped with a copper target X-ray tube in the 2θ range of 10~80° (step 0.02°, 0.3 s/step). . The microstructures of the samples were observed by field-emission scanning electron microscopy (FE-SEM, Auriga S40, Zeiss, Germany).

The combination states of O1s electrons were examined by K-Alpha X-ray photoelectron spectrometer (XPS, Thermo Scientific, USA). The optical transmittance spectra were measured with a V-570-type ultraviolet/visible/near-IR spectrophotometer (JASCO, Japan).