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Data · dataset · 2025

SEB Step Current Characteristic of GaN HEMTs

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Single-event burnout (SEB) experiments conducted on enhancement-mode GaN HEMTs, together with current measurements using a Keysight 34461A digital multimeter, revealed a new “step current” SEB characteristic, which provides a basis for studying the characteristic behavior of SEB phenomena.

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Provenance · 1 source records, 10 field assertions
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ScienceDB10.57760/sciencedb.space.033279 d agoJSON v1
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