High-resolution temperature profiling in the Î Chamber: Variability of statistical properties of temperature fluctuations

We performed high-frequency measurements (2 kHz) with the UltraFast Thermometer (UFT) at selected points along the vertical axis. The miniaturized design of the sensor with a resistive platinum-coated tungsten wire, 2.5 µm thick and 3 mm long, mounted on a miniature wire probe, allowed for vertically undisturbed temperature profiling through the chamber's depth spanning from 8 cm above the bottom to 5 cm below the top.

The collected data, consisting of 19 and 3 min time series, were used to investigate the variability of the temperature field within the chamber, aiming to better address scientific questions related to its primary objective: understanding small-scale aerosol–cloud interactions. The analyses reveal substantial variability in both variance and skewness of temperature distributions near the top and bottom plates and in the bulk (central) region, which were linked to local thermal plume dynamics.