Data · dataset · 2022
lslattery/wafer-defect-detection
Listed in Hugging Face Datasets
Dataset used by the paper: Wu, Ming-Ju, Jyh-Shing R. Jang, and Jui-Long Chen. “Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets.” IEEE Transactions on Semiconductor Manufacturing 28, no. 1 (February 2015): 1–12.
Links
Where it is published
- Hugging Face dataset page huggingface.co/datasets/lslattery/wafer-defect-detection ↗
landing page · from Hugging Face
Catalogue records · 1
- Hub API huggingface.co/api/datasets/lslattery/wafer-defect-detection ↗
metadata API · from Hugging Face
Topics
- From keywords
- Computer Science & AI
Provenance · 1 source records, 7 field assertions
| Source | Key | Last seen | Raw |
|---|---|---|---|
| Hugging Face Datasets | lslattery/wafer-defect-detection | 10 d ago | JSON v1 |
| Field | Assertion | Extractor | Evidence |
|---|---|---|---|
| access_level | source · Hugging Face | connector:huggingface@1.0.0 | /gated |
| concepts[field].local:field:computer-science-ai | mapping · Hugging Face | connector:huggingface@1.0.0 | |
| created_date | source · Hugging Face | connector:huggingface@1.0.0 | |
| description | source · Hugging Face | connector:huggingface@1.0.0 | /description |
| publication_date | source · Hugging Face | connector:huggingface@1.0.0 | |
| title | source · Hugging Face | connector:huggingface@1.0.0 | /id |
| updated_date | source · Hugging Face | connector:huggingface@1.0.0 |