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Data · dataset · 2026

Optical degradation of polysilicon light emitters operating in reach-through after high-temperature operating life testing (HTOL)

Listed in UP Research Data Repository

<p dir="ltr">High-temperature operating life testing (HTOL) is performed on polysilicon light emitters implemented in a standard CMOS process.

Description

Two different implementations of a polysilicon light emitter are tested, and the data is presented. A reduction in optical output power is measured with applied stress time, strongly dependent on the applied stress current, and weakly dependent on the applied temperature stress.

The dataset contains the normalised, measured output power reduction with the applied stress. Each normalised datapoint represents the average degradation of 4 measured devices.</p>

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Provenance · 1 source records, 7 field assertions
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UP Research Data Repositoryoai:figshare.com:article/3304747416 h agoJSON v1
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concepts[field].local:field:earth-environmentalmapping · researchdata up ac zaconnector:researchdata_up_ac_za@1.0.0
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