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Data · dataset · 2026

Dataset for conclusions on the influence of Si/SiO₂ interface traps in transistors on single‑event upset effect

Listed in ScienceDB

There are four. txt files in the data source folder of Figure 12-16 in this dataset, which are the source data of Figure 12-16 in the paper.

Description

The figures 12-16 in the paper can be drawn using the fit_deu-d ouble.cython and fit_deu_third.python programs in the drawing program folder of Figure 12-18; The bar chart in the drawing program folder of Figure 12-18. The Python program contains the source data for Figure 17 and Figure 18 of the paper.

Running this program can draw Figures 17 and 18. 

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Where it is published

Catalogue records · 1

Topics

Provenance · 1 source records, 10 field assertions
SourceKeyLast seenRaw
ScienceDB10.57760/sciencedb.j00177.0001l11 d agoJSON v1
FieldAssertionExtractorEvidence
access_levelsource · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:earth-environmentalmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:engineeringmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:humanitiesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:life-sciencesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:social-sciencemapping · scidb cnconnector:scidb_cn@1.0.0
descriptionsource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/description
licensesource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/rights
publication_datesource · scidb cnconnector:scidb_cn@1.0.0
titlesource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/title