Data for "Charge exchange of slow highly charged ions from an electron beam ion trap with surfaces and 2D materials"

Context and methodology This small review article summarises recent achievements in understanding highly charged ion interaction with 2D materials, with the three subtopics of energy deposition, secondary particle emission and energy retention/material modification.

Note that except for one figure (FIG. 3a) all figures are reproduced from other publications with permission. The data comprises a coincidence measurement result (Xe30+ transmitted through single-layer graphene) in a list-mode fashion, i.e. for single impinging ions we record the impact position (x/y) on our 2D position-sensitive particle detector and the time of flight of the projectiles from sample to detector. Data is filtered using the time of flight to depict the 2D pattern (counts vs. charge state and scattering angle) for ions transmitted through the freestanding graphene sample and the support structure.