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Table · dataset · 2019

Data for Defect dynamics in self-catalyzed III-V semiconductor nanowires

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The droplet consumption step in self-catalyzed III-V semiconductor nanowires can produce material that contains a high density of line defects.

Description

Interestingly, these defects are often associated with twin boundaries and have null Burgers vector, i.e. no long-range strain field. Here we analyze their stability by considering the forces that act on them and use in-situ aberration corrected scanning transmission electron microscopy (STEM) to observe their behavior in GaAsP NWs using short annealing cycles.

Their movement appears to be consistent with the thermally-activated single- or double-kink mechanisms of dislocation glide, with velocities that do not exceed 1 nm s-1. We find that motion of individual defects depends on their size, position, and surrounding environment and set an upper limit to activation energy around 2eV. The majority of defects (>70%) are removed by our post-growth annealing for several seconds at temperatures in excess of 640 °C, suggesting that in-situ annealing during growth at lower temperatures would significantly improve material quality.

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The remaining defects do not move at all and are thermodynamically stable in the nanowire.<br><br>Electron microscope images and data in formats .dm4, .xlsx, .tif, .png, .avi and .mp4. Filenames as follows are individually available for download: 1a.dm4: ADF STEM image of a nanowire with defective tip. 1b.dm4: ADF STEM image of a twin bounded by two Σ3 {112} twin facets. 2d.xlsx: Data for forces acting on a 3ML defect. 3a.xlsx: Data for number of moving and stationary defects after heating cycles. 3b.xlsx: Data for histogram of velocity values measured for different temperatures. 3b-i1.dm4: BF STEM image of a nanowire with defective tip. 3b-i2.dm4: BF STEM image of a nanowire with defective tip. 3b-i3.dm4: BF STEM image of a nanowire with defective tip. 4b.dm4: ADF STEM image of a 3ML defect in the process of moving. 4c.dm4: ADF STEM image of a 3ML defect in the process of moving. 4d.dm4: ADF STEM image of a region after the defect has been removed. 5a.dm4: ADF STEM image of a 3ML defect in the process of moving. 5b.dm4: ADF STEM image of a 3ML defect in the process of moving. 5c.dm4: ADF STEM image of a 3ML defect in the process of moving. 5d.dm4: ADF STEM image of a 3ML defect in the process of moving. 5e.xlsx: Data of defect positions after different heat cycles. 5f.xlsx: Data of defect velocities for different temperatures. s2a.tif: SEM image of nanowires on substrate. s2b.tif: SEM side image of nanowires with defective tips. s3a.xlsx: Data of defect positions after different heat cycles. s3b.xlsx: Data of defect velocities for different temperatures. s5a.dm4: ADF STEM image of 3ML type defects in a nanowire. s5b.dm4: ADF STEM image of 3ML type defects in a nanowire. s5c.dm4: ADF STEM image of 3ML type defects in a nanowire. s5d.dm4: ADF STEM image of 3ML type defects in a nanowire. s6a.dm4: ADF STEM image of a nanowire with defective tip. s6b.xlsx: ADF intensity profile taken across the width of a nanowire. s7a.dm4: ADF STEM image of a twin bounded by two Σ3 {112} twin facets. s8b.dm4: ADF STEM image of a 3ML defect in the process of moving. s8c.dm4: ADF STEM image of a 3ML defect in the process of moving. s8d.dm4: ADF STEM image of a 3ML defect in the process of moving.

SI1a.png: Frame from movie of a nanowire with catalyst droplet attached before heating. SI1b.png: Frame from movie of a nanowire with catalyst droplet attached after heating. SI4.png: ADF STEM image of 3ML type defects in a nanowire.

SuppMovie2-DefectMotion.avi: TEM video of a NW with catalyst droplet still attached being heated in situ and cooled and the formation of a defect observed. DefectForm3.mp4: ADF STEM video of observed defect motion

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