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Data · dataset · 2026

Elemental characteristics and X-ray diffraction analysis table of tuff samples from the Xujiahe Formation

Listed in ScienceDB

The elemental characteristic data of the sample was conducted by Chengdu Spectral Detection Technology Co., Ltd.

Description

The main trace element testing equipment were inductively coupled plasma emission spectrometer (ICP-OES, PE 5300V from the United States) and inductively coupled plasma mass spectrometer (AgClient Technologies 7700 Series ICP-MS). The X-ray diffraction analysis data was also measured by Chengdu Spectral Detection Technology Co., Ltd.

The samples were sieved through a 200 mesh sieve and tested using the Rigaku XRD/Rigaku Ultima IV instrument from Japan. 

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ScienceDB10.57760/sciencedb.010kh9 d agoJSON v1
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