R-band light curve of QSO J0158-4325 images

The high-amplitude, short-period microlensing variability for which this system is known has historically precluded a time delay measurement by conventional methods. We attempt to circumvent this limitation by the application of a Monte Carlo microlensing analysis technique, but we are only able to prove that the delay must have the expected sign (image A leads image B).

Despite our failure to robustly measure the time delay, we successfully model the microlensing at optical and X-ray wavelengths to find a half-light radius for soft X-ray emission log (r_1/2,X,soft_/cm)=14.3^+0.4^_-0.5_, an upper limit on the half-light radius for hard X-ray emission log (r_1/2,X,hard_/cm)<=14.6, and a refined estimate of the inclination-corrected scale radius of the optical R-band (rest frame 3100{AA}) continuum emission region of log (r_s_/cm)=15.6+/-0.3.