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Data · dataset · 2023

Detected diffraction pattern at Shanghai Synchrotron Radiation Beamline15U with different alignment parameters of Kirkpatrick–Baez focusing mirror

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This dataset contains two sets of diffraction images acquired at different beam conditions.

Description

The diffaction images were collected at the beamline BL15U of the Shanghai Synchrotron Radiation Facility with a photon energy of 10 keV. The beamline uses a pair of Kirkpatrick-Baez (KB) mirrors to focus the beam.

The focus spot size was about 4 × 4 μm2 measured by knife-edge scan method. The secondary source aperture was 200 × 30 μm2 for improving the beam coherence. The KB mirrors were pre-aligned with a silicon substrate at the beamline before the experiment, and its curvature can be adjusted by two bending rods.

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Adjusting the pitch angle and curvature of KB mirrors, diffraction images were collected with and without a thin sandpaper placed near the focus at different alignment parameters. The data was collected by a microscope objective lens system (Optique Peter) coupled to a complementary metal-oxide semiconductor (CMOS) camera (Hamamatsu), which was placed 2075 mm downstream from the focus. Pixel size of collected images is 1.625 μm and each image is 2048 × 2048 size.

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Provenance · 1 source records, 11 field assertions
SourceKeyLast seenRaw
ScienceDB10.57760/sciencedb.j00186.0013810 d agoJSON v1
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access_levelsource · scidb cnconnector:scidb_cn@1.0.0
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concepts[field].local:field:life-sciencesmapping · scidb cnconnector:scidb_cn@1.0.0
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concepts[modality].local:modality:imageenrichment · scidb cnkeyword-concept-rules@1.0.0title+description (75%)
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