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Table · dataset · 2016

Data for A comparison between electrochemical impedance spectroscopy and incremental capacity-differential voltage as li-ion diagnostic techniques to identify and quantify the effects of degradation modes within battery management systems

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Degradation of Lithium-ion batteries is a complex process that is caused by a variety of mechanisms.

Description

For simplicity, ageing mechanisms are often grouped into three degradation modes (DMs): conductivity loss (CL), loss of active material (LAM) and loss of lithium inventory (LLI). State of Health (SoH) is typically the parameter used by the Battery Management System (BMS) to quantify battery degradation based on the decrease in capacity and the increase in resistance.

However, the definition of SoH within a BMS does not currently include an indication of the underlying DMs causing the degradation. Previous studies have analysed the effects of the DMs using incremental capacity and differential voltage (IC-DV) and electrochemical impedance spectroscopy (EIS). The aim of this study is to compare IC-DV and EIS on the same data set to evaluate if both techniques provide similar insights into the causes of battery degradation.

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For an experimental case of parallelized cells aged differently, the effects due to LAM and LLI were found to be the most pertinent, outlining that both techniques are correlated. This approach can be further implemented within a BMS to quantify the causes of battery ageing which would support battery lifetime control strategies and future battery designs.<br><br>Characterisation test on four cells Under 01_Capacity_and_Pseudo_OCV folder: 1C capacity test and pseudo-OCV test.

Under 02_EIS folder there are two folders: 01_EIS_measurements and 02_EIS_fitting_results. 01_EIS_measurements contains EIS data for SoC 20%, 50% and 90%. Each mat file contains all the snapshots (columns 1-11, snapshot 1 to 11) and cells (rows 1-4, Cell 1 to 4). 02_EIS_fitting_results contains fitting results of the EIS data for the Adapted-Randles Equivalent Circuit Model chosen.

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