In situ measurement of the specific surface area of reduced graphene oxide using time-resolved laser induced incandescence

Intensity data of incandescent traces recorded by four separate PMTs at wavelengths of 447 nm, 545 nm, 645 nm, and 747 nm. The data is processed into five different files, named based on the reduction temperature of the tube furnace.

Each column represents a different wavelength range, as follows: 1: 447 nm, 2: 747 nm, 3: 545 nm, 4: 645 nm. The data is relatively calibrated and shortened to reflect the temperature data from the peak of the signal. Additionally, time data is appended, which directly correlates to the time of the incandescent signal.