Open Data for Multi-Criterion Single-Event Evaluation of a 28-nm Radiation-Tolerant Fractional-N PLL for Space Microprocessors

The dataset includes fractional-mode electrical performance results, heavy-ion irradiation conditions, and single-event-effect (SEE) event statistics used in the manuscript. Electrical data include fractional-divider settings, oscillator frequency, period jitter, cycle-to-cycle jitter, total jitter, deterministic jitter, random jitter, integrated rms jitter, and phase noise at a 1-MHz offset.

Irradiation data include the ion species, ion energy, range in silicon, effective linear energy transfer (LET), and fluence per run for Cl, Kr, and Ta ions. SEE statistics include total recorded events, period-triggered events, lock-triggered events, and the corresponding event cross sections under the period-plus-lock and lock-only monitoring criteria. The released data support verification of the quantitative results and major trends reported in the associated article while excluding proprietary circuit-level design details, raw oscilloscope waveforms, layout source files, device-level parameters, configuration files, and other implementation-sensitive information.