Understanding wheat lodging using multi-temporal Sentinel-1 and Sentinel- 2 data

The lodged plots were further categorised into different lodging severity classes (moderate, severe and very severe). Temporal profiles of backscatter, coherence, reflectance and continuum removed spectra were studied for healthy and lodging severity classes throughout the stem elongation to ripening growth stages. The Kruskal Wallis and posthoc Tukey tests were used to test for significant differences between different classes.

Our results for Sentinel-2 showed that red edge (740 nm) and NIR (865 nm) bands could best distinguish healthy from lodged wheat (particularly healthy and very severe). For Sentinel-1, the analysis revealed the potential of VH backscatter and the complementarity of VV and VH/VV backscatter in distinguishing a maximum number of classes. Our findings demonstrate the potential of Sentinel data for near real-time detection of the incidence and severity of lodging in wheat.

To the best of our knowledge, there is no study that has contributed to this application. Date Submitted: 2020-06-02