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Table · dataset · 2026

Data for A Generalized Convolution-Based Framework for Quantitative SIMS Depth Profiling of Nanoscale Layers

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Nanoscale layers consist of ultra-sharp dopant distributions embedded within a matrix and are increasingly important for advanced electronic and quantum devices.

Description

Although an ideal $\delta$-layer is confined to a single atomic plane, real structures have a finite spatial extent owing to growth kinetics, interfacial roughness and atomic-scale intermixing. Quantitative characterisation therefore requires the intrinsic dopant distribution to be separated from the instrumental broadening.

In secondary ion mass spectrometry (SIMS), the measured profile is a convolution of the sample distribution with an energy-dependent response function arising from ion-beam-induced effects. Previous SIMS analyses have generally represented $\delta$-layers by either Gaussian or boxcar distributions, corresponding to two limiting profile shapes. Here, we introduce a convolution-based framework employing a flexible sample function that varies continuously between these limits.

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Combined with a global multi-energy fitting strategy, the approach separates the energy-dependent response function from the energy-independent sample profile and simultaneously determines their parameters. Application to representative boron $\delta$-layer structures produces consistent fits across a broad range of primary ion energies and reproducible intrinsic profiles from independently analysed layers. The framework provides a unified method for determining the intrinsic width and shape of nanoscale layers from energy-dependent SIMS measurements.<br><br>The data supporting the findings of this study are provided in the accompanying ZIP archives.

Figures 3 and S3 present a subset of the data obtained from a single BN δ-layer. The complete raw dataset corresponding to these figures is available in the archive B Si SingleLayer.zip. Likewise, Figures 4 and S4 present a subset of the data obtained from B δ-layers in Si.

The complete raw dataset corresponding to these figures is available in the archive B MultiLayer.zip.

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Inferred from text
Mass spectrometry 75% · Nanoscale characterisation 80%
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