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Data · dataset · 2023

Integrated circuit static defect detection system for MRAM test experimental data

Listed in ScienceDB

The dataset contains data on electrical parameter changes during laser scanning using an IC static defect scanning localization system of our own design for detecting static defects in MRAM devices.

Description

By analyzing the data from abnormal chips compared to normal chips, we identify the areas where abnormal damage may occur.

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Where it is published

Catalogue records · 1

Topics

Provenance · 1 source records, 11 field assertions
SourceKeyLast seenRaw
ScienceDB10.57760/sciencedb.space.0058810 d agoJSON v1
FieldAssertionExtractorEvidence
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