Ring Oscillator Characterization under Supply Voltage and Body Bias Variation in 22nm FDSOI Technology

All measurements were performed using an Advantest V93000 automated test equipment (ATE) under systematically varied supply voltage and body bias conditions. For each bias configuration, oscillation frequency, jitter, and supply current were recorded, yielding a comprehensive reference dataset suitable for the validation of performance models and statistical variability analyses.

The ASIC was developed within the framework of the Graduate School Intelligent Methods for Test and Reliability (GS-IMTR). The dataset is intended to support researchers and engineers across a range of applications, including modeling, post-silicon tuning, and silicon lifecycle management, with particular relevance to advanced CMOS technology nodes.