Archive · dataset · 2025
Insulated-Gate Bipolar Transistor (IGBT) Accelerated Aging
Listed in NASA Data Portal
Preliminary data from thermal overstress accelerated aging using the aging and characterization system.
Description
The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and, in some cases, high-speed measurements of gate voltage, collector-emitter voltage, and collector current are available.
The data set is provided by the NASA Prognostics Center of Excellence (PCoE).
Links
Get the data
- IGBTAgingData_04022009.zip data.nasa.gov/docs/legacy/IGBTAgingData_04022009.zip ↗
download · from data nasa gov
Where it is published
- NASA Data Portal dataset page data.nasa.gov/dataset/insulated-gate-bipolar-transistor-igbt-accelerated-agi… ↗
landing page · from data nasa gov
Catalogue records · 1
- CKAN API data.nasa.gov/api/3/action/package_show?id=de64e3d3-2731-474c-bc0b-cfe56e567… ↗
metadata API · from data nasa gov
Provenance · 1 source records, 6 field assertions
| Source | Key | Last seen | Raw |
|---|---|---|---|
| NASA Data Portal | de64e3d3-2731-474c-bc0b-cfe56e567a36 | 11 d ago | JSON v1 |
| Field | Assertion | Extractor | Evidence |
|---|---|---|---|
| created_date | source · data nasa gov | connector:data_nasa_gov@1.0.0 | |
| description | source · data nasa gov | connector:data_nasa_gov@1.0.0 | /notes |
| license_text | source · data nasa gov | connector:data_nasa_gov@1.0.0 | |
| publication_date | source · data nasa gov | connector:data_nasa_gov@1.0.0 | |
| title | source · data nasa gov | connector:data_nasa_gov@1.0.0 | /title |
| updated_date | source · data nasa gov | connector:data_nasa_gov@1.0.0 |