The Date of “Polymer modification of the buried interface to build high-performance inorganic perovskite photovoltaic devices”

Stability test data- Device stability under N2 storage (up to 1200 h)- Thermal stability at 65 °C (500 h)- Humidity stability (20-30% RH, 500 h)5. Morphology and interface data- SEM images of perovskite films (top view and cross-section)- Grain size distribution extracted from image analysis6. Statistical device performance data- Individual device parameters including VOC, JSC, FF, and PCE for all tested devicesData acquisition:All measurements were performed using standard laboratory equipment including:Keithley 2400 source meter, Edinburgh FLS980 spectrometer, Varian Cary 500 UV-Vis spectrophotometer,Shanghai Zhongchen POWEREACH JC-2000C1 contact angle instrument; FEI NanoSEM 650 field emission scanning electron microscope. Data availability:All raw data are stored in spreadsheet or text formats and are available from the corresponding author upon reasonable request.Data Usage Guidelines: This data is for research purposes only and may not be used commercially without authorization.