Quartz single crystal thermal diffusivity measurements by laser flash method: from -120 °C through the α-β phase transition to 800 °C

Laser-Flash-Apparatus: Netzsch LFA 457, InSb and HgCdTe IR Detectors Raw data on single crystal quartz thermal diffusivity are given as .csv data within the corresponding sample folders: "LT" refers to low temperature (-120 °C to 400 °C), "HT" to high temperature (25 °C to 800 °C) measurements. "_001" or "_100" of the folder and .csv file names denote the measured crystallographic direction, i.e. [100] (a-axis) and [001] (c-axis), respectively.

All .csv data contain a header with information on the measurement followed by the data in columns "Time /ms" and "Detector /V". Thicknesses within the header information are given as room temperature (RT) thicknesses. They are approx. 2 mm for "HT1" specimens, approx. 4 mm and 4.7 mm for "HT2" specimens and approx. 10 mm for "Qz_cube" specimens.