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Data · dataset · 2025

Quantitative investigation of well contact impact on single event transient in sub-20 nm FinFET process

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The dataset of paper "Quantitative investigation of well contact impact on single event transient in sub-20 nm FinFET process"

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Where it is published

Catalogue records · 1

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Provenance · 1 source records, 10 field assertions
SourceKeyLast seenRaw
ScienceDB10.57760/sciencedb.j00186.0082412 d agoJSON v1
FieldAssertionExtractorEvidence
access_levelsource · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:earth-environmentalmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:engineeringmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:humanitiesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:life-sciencesmapping · scidb cnconnector:scidb_cn@1.0.0
concepts[field].local:field:social-sciencemapping · scidb cnconnector:scidb_cn@1.0.0
descriptionsource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/description
license_textsource · scidb cnconnector:scidb_cn@1.0.0
publication_datesource · scidb cnconnector:scidb_cn@1.0.0
titlesource · scidb cnconnector:scidb_cn@1.0.0/metadata/dc/title