Source Data for “Influence of Cd-Related Inclusion Defects on X/Gamma-Ray Response in Cd-Rich Nominally Undoped CdTe Single Crystals for Radiation Detection”

The data are organized according to the figure numbers in the manuscript.The dataset includes current-voltage measurements and resistivity calculations for evaluating spatial electrical uniformity in Cd-rich nominally undoped CdTe wafers; infrared transmission microscopy images, SEM-BSE images, EDS mapping, EDS line-scan data, and EDS spectra for characterizing Cd-related inclusion defects; X-ray rocking curve, near-infrared transmittance, Tauc plot, photoluminescence, Te-atmosphere annealing, and I-V data for comparing low-resistivity and high-resistivity specimens; and X-ray time-current response data, dose-rate response data, 241Am gamma-ray spectra, and energy-resolution calculations for evaluating radiation-detection performance.The tabulated data are provided mainly in XLSX or CSV format, and representative microscopy and characterization images are provided in JPG, PNG, or BMP format.

The data files are grouped into folders named Fig.1, Fig.2, Fig.3, and Fig.4, corresponding to the figures in the manuscript.