Genome assembly of Boost and gene model annotation for the wheat cultivars Boost and Timstein

<p dir="ltr"><b>"Chromosome-scale comparative genomics and temporal transcriptomics reveal coordinated immune trajectories underlying quantitative bacterial leaf streak resistance in wheat."</b></p><p dir="ltr">The study investigates the molecular basis of quantitative resistance to bacterial leaf streak (BLS), caused by <i>Xanthomonas translucens</i> pv. <i>undulosa</i> (Xtu), by integrating chromosome-scale genome assembly, comparative genomics, resistance gene annotation, structural variation analysis, and time-course RNA sequencing.</p><p dir="ltr">The repository includes datasets generated from the resistant wheat cultivar <b>Boost</b> and the susceptible cultivar <b>Timstein</b>, including chromosome-scale genome assembly, genome annotation, comparative genomic analyses, structural variation, resistance gene analog (RGA) annotation, ortholog analysis, RNA-seq differential expression analyses, and functional annotations used throughout the study.</p><p dir="ltr">These datasets support all analyses presented in the associated publication.</p>